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How to build and exploit overstressed tests to improve the knowledge of reliability and reduce development
How to build and exploit overstressed tests to improve the knowledge of reliability and reduce development
How to build and exploit overstressed tests to improve the knowledge of reliability and reduce development
Delange, L. (Autor:in) / Le Fevre, T. (Autor:in) / Schueller, G. I. / Shinozuka, M. / Yao, J. T. P. / International Association for Structural Safety and Reliability
6th International conference on structural safety and reliability, Icossar '93 ; 1993 ; Innsbruck; Austria
01.01.1993
8 pages
In 3 vols
Aufsatz (Konferenz)
Englisch
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