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Double Crystal X-Ray Spectrometer for High Sensitivity Lattice Parameter Measurements
Double Crystal X-Ray Spectrometer for High Sensitivity Lattice Parameter Measurements
Double Crystal X-Ray Spectrometer for High Sensitivity Lattice Parameter Measurements
Buschert, R. C. (Autor:in) / Guengerich, M. A. (Autor:in) / Helrich, C. S. (Autor:in) / Dolph, G. E. / Indiana Academy of Science
Spring meeting ; 1988 ; Notre Dame; IN
01.01.1988
374 pages
Also includes papers from 1988 Fall meeting
Aufsatz (Konferenz)
Englisch
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