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Numerical Analysis of the Effects of Substrate Corners and Interface Convolution on Residual Stresses in Oxide Scales
Numerical Analysis of the Effects of Substrate Corners and Interface Convolution on Residual Stresses in Oxide Scales
Numerical Analysis of the Effects of Substrate Corners and Interface Convolution on Residual Stresses in Oxide Scales
Williamson, R. L. (Autor:in) / Wright, J. K. (Autor:in) / Shores, D. A. / Rapp, R. A. / Hou, P. Y. / Electrochemical Society
Symposium, Fundamental aspects of high temperature corrosion ; 1996 ; San Antonio; TX
01.01.1996
12 pages
Held during the 190th meeting of the Electrochemical Society
Aufsatz (Konferenz)
Englisch
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