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Bridge painting defects recognition using samplying plans and image processing techniques
Bridge painting defects recognition using samplying plans and image processing techniques
Bridge painting defects recognition using samplying plans and image processing techniques
International conference, Construction information technology ; 2000 ; Reykjavik
01.01.2000
12 pages
Also known as CIT2000. Conference theme: taking the construction industry into the 21st century
Aufsatz (Konferenz)
Englisch
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