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A stochastic deterioration process for time-dependent reliability analysis
A stochastic deterioration process for time-dependent reliability analysis
A stochastic deterioration process for time-dependent reliability analysis
van Noortwijk, J. M. (Autor:in) / Pandey, M. D. (Autor:in) / Maes, M. / Huyse, L.
11th, IFIP WG 7.5 Working Conference; Reliability and optimization of structural systems ; 2003 ; Banff, Alta
01.01.2004
8 pages
Includes bibliographic references and index
Aufsatz (Konferenz)
Englisch
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