Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Thin layer and interface characterization by VisCPT
Thin layer and interface characterization by VisCPT
Thin layer and interface characterization by VisCPT
Hryciw, R. D. (Autor:in) / Shin, S. (Autor:in) / da Fonseca, A. V. / Mayne, P. W.
2nd, International conference on site characterization ; 2004 ; Porto, Portugal
01.01.2004
6 pages
Aufsatz (Konferenz)
Englisch
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