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A Digital Processor Architecture for Combined EEG/EMG Falling Risk Prediction
A Digital Processor Architecture for Combined EEG/EMG Falling Risk Prediction
A Digital Processor Architecture for Combined EEG/EMG Falling Risk Prediction
Annese, V. F. (Autor:in) / Crepaldi, M. (Autor:in) / Demarchi, D. (Autor:in) / De Venuto, D. (Autor:in)
Design, automation and test in Europe (Conference)
01.01.2016
6 pages
Aufsatz (Konferenz)
Englisch
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