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Real-time observation of the composition variation due to In-Ga replacements at the GaAs/InAs interface by coaxial impact collision ion scattering spectroscopy
Real-time observation of the composition variation due to In-Ga replacements at the GaAs/InAs interface by coaxial impact collision ion scattering spectroscopy
Real-time observation of the composition variation due to In-Ga replacements at the GaAs/InAs interface by coaxial impact collision ion scattering spectroscopy
Saitoh, T. (Autor:in) / Hashimoto, A. (Autor:in) / Tamura, M. (Autor:in)
APPLIED SURFACE SCIENCE ; 60 ; 228
01.01.1992
228 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
621.35
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