Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Effect of Powder Sample Granularity on Fluorescent Intensity and on Thermal Parameters in X-Ray Diffraction Rietveld Analysis
Effect of Powder Sample Granularity on Fluorescent Intensity and on Thermal Parameters in X-Ray Diffraction Rietveld Analysis
Effect of Powder Sample Granularity on Fluorescent Intensity and on Thermal Parameters in X-Ray Diffraction Rietveld Analysis
Sparks, C. J. (Autor:in) / Kumar, R. (Autor:in) / Specht, E. D. (Autor:in) / Zschack, P. (Autor:in)
01.01.1993
57 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
539.7222
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Rietveld refinement of the semiconducting system Bi2-xFexTe3 from X-ray powder diffraction
| British Library Online Contents | 2007
Combined Rietveld refinement of CaMgSi2O6:Eu2+ using X-ray and neutron powder diffraction data
| British Library Online Contents | 2006
Rietveld Refinement of the Crystal Structure of Silver-Oxalate from Neutron Powder Diffraction Data
| British Library Online Contents | 1996
Rietveld refinement employing X-ray data on CaWO~4 from different powder diffraction geometries
| British Library Online Contents | 1993