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Structural and electrical study of epitaxially realigned Sb-doped polycrystalline Si films
Structural and electrical study of epitaxially realigned Sb-doped polycrystalline Si films
Structural and electrical study of epitaxially realigned Sb-doped polycrystalline Si films
Cacciato, A. (Autor:in) / Benyaich, F. (Autor:in) / Spinella, C. (Autor:in) / Rimini, E. (Autor:in)
01.01.1993
289 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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