Nanoparticle-terminated scanning probe microscopy tips and surface samples

Vakarelski, I.U. / Brown, S.C. / Moudgil, B.M. et al. | British Library Online Contents | 2007

Coating tips used in electrical scanning probe microscopy with W and AuPd

Huang, H. S. / Cheng, H. M. / Lin, L. J. | British Library Online Contents | 2005

Scanning Probe Microscopy: Electrical Scanning Probe Microscopy on Active Organic Electronic Devices (Adv. Mater. 1/2009)

Pingree, L. S. / Reid, O. G. / Ginger, D. S. | British Library Online Contents | 2009

Material Sciences: "Nanometric Engineering"

Ramachandra Rao, P. / Indian Science Congress Association | British Library Conference Proceedings | 1994

Multiple internal reflection spectroscopy: a sensitive non-destructive probe for interfaces and nanometric layers

Olivier, M. / Rochat, N. / Chabli, A. et al. | British Library Online Contents | 2001