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Strain effects on carrier lifetimes in InGaAs/(Al)GaAs multiple quantum wells
Strain effects on carrier lifetimes in InGaAs/(Al)GaAs multiple quantum wells
Strain effects on carrier lifetimes in InGaAs/(Al)GaAs multiple quantum wells
Moloney, M. H. (Autor:in) / Hegarty, J. (Autor:in) / Buydens, L. (Autor:in) / Demeester, P. (Autor:in)
01.01.1993
253 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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