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Process-induced defects in manufacture of GaAs monolithic microwave integrated circuits

Purohit, R. K. / Dubey, G. C. / Dayal, S. / Gulati, R.

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Process-induced defects in manufacture of GaAs monolithic microwave integrated circuits

Purohit, R. K. / Dubey, G. C. / Dayal, S. / Gulati, R.

Process-induced defects in manufacture of GaAs monolithic microwave integrated circuits

Purohit, R. K. / Dubey, G. C. / Dayal, S. / Gulati, R.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

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Dokumentinformationen

Ähnliche Titel

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Dokumentinformationen

Titel:

Process-induced defects in manufacture of GaAs monolithic microwave integrated circuits

Beteiligte:

Purohit, R. K. (Autor:in) / Dubey, G. C. (Autor:in) / Dayal, S. (Autor:in) / Gulati, R. (Autor:in) / Fornani, R.

Erschienen in:

2nd International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies ; 268

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 28

Erscheinungsdatum:

01.01.1994

Format / Umfang:

268 pages

ISSN:

0921-5107

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Unbekannt

Klassifikation:

DDC: 620.11

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