Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Electromagnetic Imaging Using Mutual Inductance Tomography: Potential for Process Applications
Electromagnetic Imaging Using Mutual Inductance Tomography: Potential for Process Applications
Electromagnetic Imaging Using Mutual Inductance Tomography: Potential for Process Applications
Peyton, A. J. (Autor:in) / Yu, Z. Z. (Autor:in) / Al-Zeibak, S. (Autor:in) / Saunders, N. H. (Autor:in)
01.01.1995
68 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.43
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