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The Use of Simulated Standards in Quantitative Electron Probe Microanalysis with Energy-Dispersive X-Ray Spectrometry
The Use of Simulated Standards in Quantitative Electron Probe Microanalysis with Energy-Dispersive X-Ray Spectrometry
The Use of Simulated Standards in Quantitative Electron Probe Microanalysis with Energy-Dispersive X-Ray Spectrometry
Newbury, D. E. (Autor:in) / Myklebust, R. L. (Autor:in) / Swyt, C. R. (Autor:in)
MICROBEAM ANALYSIS -DEERFIELD BEACH- ; 4 ; 221-238
01.01.1995
18 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
544
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