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AFM and RHEED study of Ge islanding on Si(111) and Si(100)
AFM and RHEED study of Ge islanding on Si(111) and Si(100)
AFM and RHEED study of Ge islanding on Si(111) and Si(100)
Deelman, P. W. (Autor:in) / Thundat, T. (Autor:in) / Schowalter, L. J. (Autor:in)
APPLIED SURFACE SCIENCE ; 104/105 ; 510-515
01.01.1996
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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