Studying grain boundary regions in polycrystalline materials using spherical nano-indentation and orientation imaging microscopy

Pathak, S. / Michler, J. / Wasmer, K. et al. | British Library Online Contents | 2012

Orientation imaging microscopy: application to the measurement of grain boundary structure

Adams, B. L. | British Library Online Contents | 1993

Estimating geometric dislocation densities in polycrystalline materials from orientation imaging microscopy

Man, C. S. / Gao, X. / Godefroy, S. et al. | British Library Online Contents | 2010

Grain Orientation Mapping of Polycrystalline Organic Semiconductor Films by Transverse Shear Microscopy

Kalihari, V. / Tadmor, E. B. / Haugstad, G. et al. | British Library Online Contents | 2008

Grain Boundary Effects and Failure Evolution in Polycrystalline Materials

Ashmawi, W. M. / Zikry, M. A. | Springer Verlag | 2004