Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Interfacial Characterisation of MMCs and CMCs using a SEM-Pushout Technique
Interfacial Characterisation of MMCs and CMCs using a SEM-Pushout Technique
Interfacial Characterisation of MMCs and CMCs using a SEM-Pushout Technique
Janczak, J. (Autor:in) / Buerki, G. (Autor:in) / Rohr, L. (Autor:in)
KEY ENGINEERING MATERIALS ; 623-630
01.01.1997
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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