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Correlation Between Nanoscale Structural, Electronic, and Magnetic Properties of Thin Films by Scanning-Probe Microscopy and Spectroscopy
Correlation Between Nanoscale Structural, Electronic, and Magnetic Properties of Thin Films by Scanning-Probe Microscopy and Spectroscopy
Correlation Between Nanoscale Structural, Electronic, and Magnetic Properties of Thin Films by Scanning-Probe Microscopy and Spectroscopy
Wiesendanger, R. (Autor:in) / Yu, E. T. / Pennycook, S. J.
01.01.1997
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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