Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
High-Resolution-Electron-Microscopy Investigation of Nanosize Inclusions
High-Resolution-Electron-Microscopy Investigation of Nanosize Inclusions
High-Resolution-Electron-Microscopy Investigation of Nanosize Inclusions
Dahmen, U. (Autor:in) / Johnson, E. (Autor:in) / Xiao, S. Q. (Autor:in) / Johansen, A. (Autor:in) / Yu, E. T. / Pennycook, S. J.
01.01.1997
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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