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Determination of Stress Gradients in a Thermally Grown Oxide Layer Using X-Ray Diffraction
Determination of Stress Gradients in a Thermally Grown Oxide Layer Using X-Ray Diffraction
Determination of Stress Gradients in a Thermally Grown Oxide Layer Using X-Ray Diffraction
Zhu, D. (Autor:in) / Stout, J. H. (Autor:in) / Shores, D. A. (Autor:in) / Streiff, R. / Stringer, J. / Krutenat, R. C. / Caillet, M. / Rapp, R. A.
01.01.1997
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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