Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Secondary Extinction Used in Thickness and Pole Density Measurements of Textured Films by X-Ray Diffraction
Tomov, I. (Autor:in)
MATERIALS SCIENCE FORUM ; 273/275 ; 145-150
01.01.1998
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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