Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Routine analysis at sub-micron resolution through the use of sputtered initiated resonance ionization spectroscopy
Routine analysis at sub-micron resolution through the use of sputtered initiated resonance ionization spectroscopy
Routine analysis at sub-micron resolution through the use of sputtered initiated resonance ionization spectroscopy
Willey, K.F. (Autor:in) / Arlinghaus, H.F. (Autor:in) / Whitaker, T.J. (Autor:in)
APPLIED SURFACE SCIENCE ; 144 ; 36-40
01.01.1999
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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