Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Contrast mechanisms of secondary electron images in scanning electron and ion microscopy
Contrast mechanisms of secondary electron images in scanning electron and ion microscopy
Contrast mechanisms of secondary electron images in scanning electron and ion microscopy
Sakai, Y. (Autor:in) / Yamada, T. (Autor:in) / Suzuki, T. (Autor:in) / Ichinokawa, T. (Autor:in)
APPLIED SURFACE SCIENCE ; 144 ; 96-100
01.01.1999
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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