Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
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Effects of temperature on the resistivity of vacuum deposited Cu-MgF~2 cermet thin films: an investigation of conduction mechanism
Effects of temperature on the resistivity of vacuum deposited Cu-MgF~2 cermet thin films: an investigation of conduction mechanism
Effects of temperature on the resistivity of vacuum deposited Cu-MgF~2 cermet thin films: an investigation of conduction mechanism
KATUMBA, G. (Autor:in) / OLUMEKOR, L. (Autor:in)
JOURNAL OF MATERIALS SCIENCE ; 34 ; 6041-6044
01.01.1999
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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