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The microstructure of continuously processed YBa~2Cu~3O~y coated conductors with underlying CeO~2 and ion-beam-assisted yttria-stabilized zirconia buffer layers
The microstructure of continuously processed YBa~2Cu~3O~y coated conductors with underlying CeO~2 and ion-beam-assisted yttria-stabilized zirconia buffer layers
The microstructure of continuously processed YBa~2Cu~3O~y coated conductors with underlying CeO~2 and ion-beam-assisted yttria-stabilized zirconia buffer layers
Holesinger, T. G. (Autor:in) / Foltyn, S. R. (Autor:in) / Arendt, P. N. (Autor:in) / Kung, H. (Autor:in) / Jia, Q. X. (Autor:in) / Dickerson, R. M. (Autor:in) / Dowden, P. C. (Autor:in) / DePaula, R. F. (Autor:in) / Groves, J. R. (Autor:in) / Coulter, J. Y. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 15 ; 1110-1119
01.01.2000
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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