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Investigation of residual stresses in microsystems using X-ray diffraction
Investigation of residual stresses in microsystems using X-ray diffraction
Investigation of residual stresses in microsystems using X-ray diffraction
Kampfe, B. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- A ; 288 ; 119 - 125
01.01.2000
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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