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Investigation of deep levels in semi-insulating GaAs by means of a thermally activated piezoelectric photoacoustic measurements
Investigation of deep levels in semi-insulating GaAs by means of a thermally activated piezoelectric photoacoustic measurements
Investigation of deep levels in semi-insulating GaAs by means of a thermally activated piezoelectric photoacoustic measurements
Ikari, T. (Autor:in) / Fukuyama, A. (Autor:in) / Akashi, Y. (Autor:in)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 4 ; 253-255
01.01.2001
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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