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Identification of Vacancies on each Sublattice of SiC by Coincident Doppler Broadening of the Positron Annihilation Photons after Electron Irradiation
Identification of Vacancies on each Sublattice of SiC by Coincident Doppler Broadening of the Positron Annihilation Photons after Electron Irradiation
Identification of Vacancies on each Sublattice of SiC by Coincident Doppler Broadening of the Positron Annihilation Photons after Electron Irradiation
Muller, M. A. (Autor:in) / Rempel, A. A. (Autor:in) / Reichle, K. (Autor:in) / Sprengel, W. (Autor:in) / Major, J. (Autor:in) / Schaefer, H.-E. (Autor:in)
MATERIALS SCIENCE FORUM ; 363/365 ; 70-72
01.01.2001
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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