GaAs wafer mapping by microwave-detected photoconductivity

Niklas, J. R. / Siegel, W. / Jurisch, M. et al. | British Library Online Contents | 2001

Excess Carrier Lifetime Mapping for Bulk SiC Wafers by Microwave Photoconductivity Decay Method and Its Relationship with Structural Defect Distribution

Kato, M. / Ichimura, M. / Arai, E. et al. | British Library Online Contents | 2004

Excess Carrier Lifetimes in a Bulk p-Type SiC Wafer Measured by the Microwave Photoconductivity Decay Method

Kawai, M. / Mori, T. / Kato, M. et al. | British Library Online Contents | 2007

Fast, high resolution, inline contactless electrical semiconductor characterization for photovoltaic applications by microwave detected photoconductivity

Dornich, K. / Schuler, N. / Berger, B. et al. | British Library Online Contents | 2013

Characterization of the Excess Carrier Lifetime of As-Grown and Electron Irradiated Epitaxial p-Type 4H-SiC Layers by the Microwave Photoconductivity Decay Method

Matsushita, Y. / Kato, M. / Ichimura, M. et al. | British Library Online Contents | 2010