Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Analysis of XRD stress measurement data of naturally grown oxide films Al~2O~3 and Cr~2O~3 based on existing Reuss, Voigt, and Hill models
Analysis of XRD stress measurement data of naturally grown oxide films Al~2O~3 and Cr~2O~3 based on existing Reuss, Voigt, and Hill models
Analysis of XRD stress measurement data of naturally grown oxide films Al~2O~3 and Cr~2O~3 based on existing Reuss, Voigt, and Hill models
Sarioglu, C. (Autor:in)
SURFACE ENGINEERING -LONDON- ; 18 ; 105-112
01.01.2002
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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