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Depth-Profiling of Phase Composition and Texture in Layered-Graded Al~2O~3- & Ti~3SiC~2-Based Systems Using X-Ray and Synchrotron Radiation Diffraction
Depth-Profiling of Phase Composition and Texture in Layered-Graded Al~2O~3- & Ti~3SiC~2-Based Systems Using X-Ray and Synchrotron Radiation Diffraction
Depth-Profiling of Phase Composition and Texture in Layered-Graded Al~2O~3- & Ti~3SiC~2-Based Systems Using X-Ray and Synchrotron Radiation Diffraction
Low, I. M. (Autor:in) / Singh, M. (Autor:in) / Manurung, P. (Autor:in) / Wren, E. (Autor:in) / Sheppard, D. P. (Autor:in) / Barsoum, M. W. (Autor:in) / Gong, J. / Pan, W.
01.01.2002
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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