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Observation of Si(100) surface with noncontact atomic force microscope at 5K
Observation of Si(100) surface with noncontact atomic force microscope at 5K
Observation of Si(100) surface with noncontact atomic force microscope at 5K
Uozumi, T. (Autor:in) / Tomiyoshi, Y. (Autor:in) / Suehira, N. (Autor:in) / Sugawara, Y. (Autor:in) / Morita, S. (Autor:in)
APPLIED SURFACE SCIENCE ; 188 ; 279-284
01.01.2002
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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