Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
On the evaluation of the ductility of thin films
On the evaluation of the ductility of thin films
On the evaluation of the ductility of thin films
Antunes, J. M. (Autor:in) / Menezes, L. F. (Autor:in) / Vieira, M. F. (Autor:in) / Fernandes, J. V. (Autor:in) / Trindade, B. (Autor:in) / Ramos, A. S. (Autor:in) / Vieira, M. T. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING A -LAUSANNE- ; 337 ; 97 - 103
01.01.2002
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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