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A Novel Profilometer for Nanometric Form Assessment for Large Machined Surfaces
A Novel Profilometer for Nanometric Form Assessment for Large Machined Surfaces
A Novel Profilometer for Nanometric Form Assessment for Large Machined Surfaces
Yang, H. (Autor:in) / Kim, S. (Autor:in) / Walker, D. (Autor:in) / Pearce, T. / Gao, Y. / Tamaki, J. / Kuriyagawa, T.
01.01.2004
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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