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XPS Analysis and Atomic Force Microscopy Observation of Micro-Liquids Adsorbed on Pure Iron and Copper Surfaces
XPS Analysis and Atomic Force Microscopy Observation of Micro-Liquids Adsorbed on Pure Iron and Copper Surfaces
XPS Analysis and Atomic Force Microscopy Observation of Micro-Liquids Adsorbed on Pure Iron and Copper Surfaces
Wang, R. (Autor:in) / Kido, M. (Autor:in) / Suzumura, F. (Autor:in) / Kang, S.-G. / Kobayashi, T.
01.01.2004
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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