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Measurements of In-Plane Material Properties with Scanning Probe Microscopy
Measurements of In-Plane Material Properties with Scanning Probe Microscopy
Measurements of In-Plane Material Properties with Scanning Probe Microscopy
Carpick, R. W. (Autor:in) / Eriksson, M. A. (Autor:in)
MRS BULLETIN- MATERIALS RESEARCH SOCIETY ; 29 ; 472-477
01.01.2004
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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