Measuring surface roughness in transmission geometry [4100-25]

Ignatovich, V. K. / SPIE | British Library Conference Proceedings | 2000

Diffraction Tomographic Imaging in a Monostatic Measurement Geometry

Molyneux, J.E. | Online Contents | 1993

Simulation of Crystal Structure, Surface Geometry and Electron Diffraction Using the Personal Computer (NEC-PC9801)

Noguchi, F. / Miura, H. / Mitamura, T. | British Library Conference Proceedings | 1993

X-ray diffraction in amorphous microwires (Fe75.5B13Si11Mo0.5): influence of their geometry

del Val, J. J. / Gonzalez, J. / Zukhov, A. | British Library Online Contents | 2004

Atomic Geometry of the Si(111)√3 × √3-Sn Surface by X-ray Photoelectron and Auger Electron Diffraction

Higashiyama, K. / Park, C. Y. / Kono, S. | Springer Verlag | 1988