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Raman Microscopy Investigations and Electrical Characterisation of Indentation-Induced Phase Transformations in Silicon
Raman Microscopy Investigations and Electrical Characterisation of Indentation-Induced Phase Transformations in Silicon
Raman Microscopy Investigations and Electrical Characterisation of Indentation-Induced Phase Transformations in Silicon
Khayyat, M. M. (Autor:in) / Hasko, D. G. (Autor:in) / Chaudhri, M. M. (Autor:in) / Mendez-Vilas, A.
01.01.2005
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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