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The Sensitivity of Focusing, Parallel Beam and Mixed Optics to Alignment Errors in XRD Residual Stress Measurements
The Sensitivity of Focusing, Parallel Beam and Mixed Optics to Alignment Errors in XRD Residual Stress Measurements
The Sensitivity of Focusing, Parallel Beam and Mixed Optics to Alignment Errors in XRD Residual Stress Measurements
Vermeulen, A. C. (Autor:in) / Denis, S. / Hanabusa, T. / He, B. / Mittemeijer, E. / Nan, J. / Noyan, I. C. / Scholtes, B. / Tanaka, K. / Xu, K.
01.01.2005
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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