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Investigation of wear mechanisms through in situ observation during microscratching inside the scanning electron microscope

Michler, J. / Rabe, R. / Bucaille, J. L. / Moser, B. / Schwaller, P. / Breguet, J. M.

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Investigation of wear mechanisms through in situ observation during microscratching inside the scanning electron microscope

Michler, J. / Rabe, R. / Bucaille, J. L. / Moser, B. / Schwaller, P. / Breguet, J. M.

Investigation of wear mechanisms through in situ observation during microscratching inside the scanning electron microscope

Michler, J. / Rabe, R. / Bucaille, J. L. / Moser, B. / Schwaller, P. / Breguet, J. M.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

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Ähnliche Titel

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Dokumentinformationen

Titel:

Investigation of wear mechanisms through in situ observation during microscratching inside the scanning electron microscope

Beteiligte:

Michler, J. (Autor:in) / Rabe, R. (Autor:in) / Bucaille, J. L. (Autor:in) / Moser, B. (Autor:in) / Schwaller, P. (Autor:in) / Breguet, J. M. (Autor:in)

Erschienen in:

WEAR -LAUSANNE- ; 259 ; 18-26

Erscheinungsdatum:

01.01.2005

Format / Umfang:

9 pages

ISSN:

0043-1648

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11292

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