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Dependence of the microstructural and the electrical properties on the annealing temperature and Hg-cell fluxes for in situ annealed Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers
Dependence of the microstructural and the electrical properties on the annealing temperature and Hg-cell fluxes for in situ annealed Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers
Dependence of the microstructural and the electrical properties on the annealing temperature and Hg-cell fluxes for in situ annealed Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers
Ryu, Y. S. (Autor:in) / Kang, T. W. (Autor:in) / Kim, T. W. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 122 ; 80-83
01.01.2005
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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