Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Optical Profiling Quantifies Wear
Optical Profiling Quantifies Wear
Optical Profiling Quantifies Wear
Zecchino, M. (Autor:in) / Cohen, D. K. (Autor:in)
ADVANCED MATERIALS AND PROCESSES ; 163 ; 32-34
01.01.2005
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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