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A New Knowledge Discovery Model for Extracting Diagnosis Rules of Manufacturing Process
A New Knowledge Discovery Model for Extracting Diagnosis Rules of Manufacturing Process
A New Knowledge Discovery Model for Extracting Diagnosis Rules of Manufacturing Process
Tsai, Y. C. (Autor:in) / Cheng, C. H. (Autor:in) / Chang, J. R. (Autor:in) / Jywe, W. / Chen, C.-L. / Fan, K.-C. / Fung, R. F. / Hanson, S. G. / Hsieh, W.-H. / Hsu, C.-L.
01.01.2006
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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Knowledge Application Model for Manufacturing Process
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