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Surface states and annihilation characteristics of positrons trapped at reconstructed semiconductor surfaces
Surface states and annihilation characteristics of positrons trapped at reconstructed semiconductor surfaces
Surface states and annihilation characteristics of positrons trapped at reconstructed semiconductor surfaces
Fazleev, N. G. (Autor:in)
APPLIED SURFACE SCIENCE ; 252 ; 3333-3341
01.01.2006
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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