Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
The effect of thickness on the Bi-Ge-Sb-Te films for reversible phase-change optical recording
The effect of thickness on the Bi-Ge-Sb-Te films for reversible phase-change optical recording
The effect of thickness on the Bi-Ge-Sb-Te films for reversible phase-change optical recording
Lin, S. S. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 129 ; 116-120
01.01.2006
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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