Reflection electron energy loss spectroscopy of nanometric oxide layers and of their interfaces with a substrate: Fid-Bau Portal

Reflection electron energy loss spectroscopy of nanometric oxide layers and of their interfaces with a substrate

Paumier, F. / Fouquet, V. / Guittet, M. J. / Gautier-Soyer, M. / French, R. H. / Tan, G. / Chiang, Y. M. / Tang, M. / Ramos, A. / Chung, S. Y.

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Reflection electron energy loss spectroscopy of nanometric oxide layers and of their interfaces with a substrate

Paumier, F. / Fouquet, V. / Guittet, M. J. / Gautier-Soyer, M. / French, R. H. / Tan, G. / Chiang, Y. M. / Tang, M. / Ramos, A. / Chung, S. Y.

Reflection electron energy loss spectroscopy of nanometric oxide layers and of their interfaces with a substrate

Paumier, F. / Fouquet, V. / Guittet, M. J. / Gautier-Soyer, M. / French, R. H. / Tan, G. / Chiang, Y. M. / Tang, M. / Ramos, A. / Chung, S. Y.

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Verfügbarkeit in meiner Bibliothek prüfen

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Titel:

Reflection electron energy loss spectroscopy of nanometric oxide layers and of their interfaces with a substrate

Beteiligte:

Paumier, F. (Autor:in) / Fouquet, V. (Autor:in) / Guittet, M. J. (Autor:in) / Gautier-Soyer, M. (Autor:in) / French, R. H. (Autor:in) / Tan, G. (Autor:in) / Chiang, Y. M. (Autor:in) / Tang, M. (Autor:in) / Ramos, A. (Autor:in) / Chung, S. Y. (Autor:in)

Erschienen in:

MATERIALS SCIENCE AND ENGINEERING A ; 422 ; 29-40

Erscheinungsdatum:

01.01.2006

Format / Umfang:

12 pages

ISSN:

0921-5093

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

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