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Characterization and control of microstructure in combinatorially prepared aluminum-silicon thin film nanocomposites

Olk, C. H. / Haddad, D. B.

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Characterization and control of microstructure in combinatorially prepared aluminum-silicon thin film nanocomposites

Olk, C. H. / Haddad, D. B.

Characterization and control of microstructure in combinatorially prepared aluminum-silicon thin film nanocomposites

Olk, C. H. / Haddad, D. B.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

Seitennavigation

Dokumentinformationen

Ähnliche Titel

Exportieren, teilen und zitieren

Dokumentinformationen

Titel:

Characterization and control of microstructure in combinatorially prepared aluminum-silicon thin film nanocomposites

Beteiligte:

Olk, C. H. (Autor:in) / Haddad, D. B. (Autor:in)

Erschienen in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 21 ; 1221-1228

Erscheinungsdatum:

01.01.2006

Format / Umfang:

8 pages

ISSN:

0884-2914

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

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