Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Automatic Defect Characterization using Artificial Neural Networks and Deconvolution Techniques
Automatic Defect Characterization using Artificial Neural Networks and Deconvolution Techniques
Automatic Defect Characterization using Artificial Neural Networks and Deconvolution Techniques
Jian, X. (Autor:in) / Guo, N. (Autor:in) / Du, H. (Autor:in) / Li, M. X. (Autor:in) / Zhang, H. L. (Autor:in)
JOURNAL OF INTELLIGENT MATERIAL SYSTEMS AND STRUCTURES ; 17 ; 713-720
01.01.2006
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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