Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Nondestructive Dynamic Process Monitoring Using Electrical Capacitance Tomography
Nondestructive Dynamic Process Monitoring Using Electrical Capacitance Tomography
Nondestructive Dynamic Process Monitoring Using Electrical Capacitance Tomography
Ijaz, U. Z. (Autor:in) / Kim, J. H. (Autor:in) / Kim, M. C. (Autor:in) / Kim, S. (Autor:in) / Park, J. W. (Autor:in) / Kim, K. Y. (Autor:in) / Lee, S.-S. / Lee, J. H. / Park, I. K. / Song, S.-J.
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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